同大類學(xué)科其它級(jí)別期刊:
中科院 1區(qū) 期刊 JCR Q1 期刊 中科院 2區(qū) 期刊 JCR Q2 期刊 中科院 3區(qū) 期刊 JCR Q3 期刊 中科院 4區(qū) 期刊 JCR Q4 期刊國(guó)際簡(jiǎn)稱:APPL COMPUT ELECTROM 參考譯名:應(yīng)用計(jì)算電磁學(xué)會(huì)期刊
主要研究方向:工程技術(shù)-電信學(xué) 非預(yù)警期刊 審稿周期: 偏慢,4-8周
《應(yīng)用計(jì)算電磁學(xué)會(huì)期刊》(Applied Computational Electromagnetics Society Journal)是一本由Applied Computational Electromagnetics Society (ACES)出版的以工程技術(shù)-電信學(xué)為研究特色的國(guó)際期刊,發(fā)表該領(lǐng)域相關(guān)的原創(chuàng)研究文章、評(píng)論文章和綜述文章,及時(shí)報(bào)道該領(lǐng)域相關(guān)理論、實(shí)踐和應(yīng)用學(xué)科的最新發(fā)現(xiàn),旨在促進(jìn)該學(xué)科領(lǐng)域科學(xué)信息的快速交流。該期刊是一本未開(kāi)放期刊,近三年沒(méi)有被列入預(yù)警名單。
The ACES Journal is devoted to the exchange of information in computational electromagnetics, to the advancement of the state of the art, and to the promotion of related technical activities. A primary objective of the information exchange is the elimination of the need to "re-invent the wheel" to solve a previously solved computational problem in electrical engineering, physics, or related fields of study.
The ACES Journal welcomes original, previously unpublished papers, relating to applied computational electromagnetics. All papers are refereed.
A unique feature of ACES Journal is the publication of unsuccessful efforts in applied computational electromagnetics. Publication of such material provides a means to discuss problem areas in electromagnetic modeling. Manuscripts representing an unsuccessful application or negative result in computational electromagnetics is considered for publication only if a reasonable expectation of success (and a reasonable effort) are reflected.
The technical activities promoted by this publication include code validation, performance analysis, and input/output standardization; code or technique optimization and error minimization; innovations in solution technique or in data input/output; identification of new applications for electromagnetics modeling codes and techniques; integration of computational electromagnetics techniques with new computer architectures; and correlation of computational parameters with physical mechanisms.
CiteScore | SJR | SNIP | CiteScore 指數(shù) | ||||||||||||
1.6 | 0.224 | 0.304 |
|
名詞解釋:CiteScore 是衡量期刊所發(fā)表文獻(xiàn)的平均受引用次數(shù),是在 Scopus 中衡量期刊影響力的另一個(gè)指標(biāo)。當(dāng)年CiteScore 的計(jì)算依據(jù)是期刊最近4年(含計(jì)算年度)的被引次數(shù)除以該期刊近四年發(fā)表的文獻(xiàn)數(shù)。例如,2022年的 CiteScore 計(jì)算方法為:2022年的 CiteScore =2019-2022年收到的對(duì)2019-2022年發(fā)表的文件的引用數(shù)量÷2019-2022年發(fā)布的文獻(xiàn)數(shù)量 注:文獻(xiàn)類型包括:文章、評(píng)論、會(huì)議論文、書(shū)籍章節(jié)和數(shù)據(jù)論文。
Top期刊 | 綜述期刊 | 大類學(xué)科 | 小類學(xué)科 | ||
否 | 否 | 計(jì)算機(jī)科學(xué) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程:電子與電氣 TELECOMMUNICATIONS 電信學(xué) | 4區(qū) 4區(qū) |
Top期刊 | 綜述期刊 | 大類學(xué)科 | 小類學(xué)科 | ||
否 | 否 | 計(jì)算機(jī)科學(xué) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程:電子與電氣 TELECOMMUNICATIONS 電信學(xué) | 4區(qū) 4區(qū) |
Top期刊 | 綜述期刊 | 大類學(xué)科 | 小類學(xué)科 | ||
否 | 否 | 計(jì)算機(jī)科學(xué) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程:電子與電氣 TELECOMMUNICATIONS 電信學(xué) | 4區(qū) 4區(qū) |
Top期刊 | 綜述期刊 | 大類學(xué)科 | 小類學(xué)科 | ||
否 | 否 | 工程技術(shù) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程:電子與電氣 TELECOMMUNICATIONS 電信學(xué) | 4區(qū) 4區(qū) |
Top期刊 | 綜述期刊 | 大類學(xué)科 | 小類學(xué)科 | ||
否 | 否 | 計(jì)算機(jī)科學(xué) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程:電子與電氣 TELECOMMUNICATIONS 電信學(xué) | 4區(qū) 4區(qū) |
Top期刊 | 綜述期刊 | 大類學(xué)科 | 小類學(xué)科 | ||
否 | 否 | 計(jì)算機(jī)科學(xué) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程:電子與電氣 TELECOMMUNICATIONS 電信學(xué) | 4區(qū) 4區(qū) |
按JIF指標(biāo)學(xué)科分區(qū) | 收錄子集 | 分區(qū) | 排名 | 百分位 |
學(xué)科:ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q4 | 319 / 352 |
9.5% |
學(xué)科:TELECOMMUNICATIONS | SCIE | Q4 | 109 / 119 |
8.8% |
按JCI指標(biāo)學(xué)科分區(qū) | 收錄子集 | 分區(qū) | 排名 | 百分位 |
學(xué)科:ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q4 | 325 / 354 |
8.33% |
學(xué)科:TELECOMMUNICATIONS | SCIE | Q4 | 112 / 119 |
6.3% |
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若用戶需要出版服務(wù),請(qǐng)聯(lián)系出版商:APPLIED COMPUTATIONAL ELECTROMAGNETICS SOC, UNIV MISSISSIPPI, DEPT ELECTRICAL ENGINEERING, UNIVERSITY, USA, MS, 38677。